Beckman Coulter LS13320XR Particle Size Analyzer

Beckman Coulter LS13320XR Particle Size Analyzer

Beckman Coulter LS13320XR Particle Size Analyzer plus advanced Polarization Intensity Differential Scattering (PIDS) technology enable high-resolution measurement & reporting of real data down to 10 nm and up to 3,500 µm. With full implementation of both Fraunhofer and Mie Theories and analysis of vertical and horizontal polarized light at six different angles using three additional 475, 613, 750 and 900 nm wavelengths improves the accurate characterization of the smallest component submicron particles will not missed. ADAPT Software features simplifies method creation for standardized measurements thus automatically highlights pass/fail results for faster quality control.

Features :
Laser Diffraction Plus Advanced PIDS
High-Resolution Measurement To Spot Small Differences
Easy-To-Use ADAPT Software
Software 21 CFR Part 11 Ready

DETAILS THAT MATTER
• Expanded measurement range: 10 nm – 3,500 μm
 - Provides real (not extrapolated) analytical data down to 10 nm, and high-resolution measurements up to 3,500 μm
• Enhanced PIDS technology: Polarization Intensity Differential Scattering
 - Enables more precise raw data detection and increased detector sensitivity of vertical and horizontal polarized scattered light for sub-μm particle size analysis - a measurement quality previously unavailable
• Advanced automodality
 - No knowledge about particle size distribution (e.g., multiple fractions, narrow distribution) needed prior to measurement in order to obtain a correct result
• Optimized, intuitive software
 - Requires 2 clicks from Start Measurement to result
 - Includes an integrated optical constants database
 - Helpful user diagnostics keep you informed
 - Streamlines workflows to save time

SPECIFICATIONS
Technology: Low-angle forward light scattering with additional PIDS (Polarization Intensity Differential Scattering) Technology. Analysis of vertical and horizontal polarized light at six different angles using three additional wavelengths. Full implementation of both Fraunhofer and Mie Theories.
Light source 
Diffraction: Laser diode (785 nm)
PIDS: Tungsten lamp with high-quality band-pass filters (475, 613 and 900 nm)
Particle size analysis range: 
 - Measurement range: 10 nm – 3,500 μm
 - Dry Powder System Module (DPS): 400 nm - 3,500 μm
 - Universal Liquid Module (ULM): 10 nm - 2,000 μm
Electrical interface:  USB
Power consumption: ≤ 6 amps @ 90 - 125 VAC; ≤ 3 amps @ 220 - 240 VAC
Temperature range: 10 - 40°C (50 – 104°F)
Humidity: 0 - 90% without condensation
Compliance: Creates 21 CFR Part 11 enabling features RoHS
Certifications:
 - EU EMC Directive 2014/30/EU
 - CISPR 11:2009/A1:2010
 - Australia and New Zealand RCM Mark
Data export file formats: XLSX, TSV, PDF
File import capability: From all LS 13 320 Legacy and LS 13 320 XR systems
*Software operating system: Requires Microsoft Windows 10, 64-bit environment
(U.S. English regional settings only)
Dimensions Height: 19.5” (49.53 cm)
Width: 37” (93.98 cm)
Depth: 10” (25.4 cm)
Weight 52 lbs (23.5 kg)

Please Call 03- 5131 8616 or Email enquiry@cesstech.com.my for further information or quotation.

Last Updated @ 29/9/2021 2:26:50 PM